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SU-1500 by Hitachi

The footprint of SU-1500 has been reduced by 20% (*) so that the microscope can be installed in more restricted places than before.

To assist inexperienced users, the SU-1500 includes an on screen operating guide that walk the user step be step through the complete imaging process - from vacuum mode selection to taking a picture. This unique feature allows users of all experience levels to quickly obtain high quality images.



The advanced technologies incorporated into the SU-1500 provide a guaranteed secondary electron resolution of 4.0nm (variable pressure mode).

For quick observation of non-conductive samples, the SU-1500 utilizes variable pressure mode that eliminates negative charging, and provided the optimum conditions for both imaging and EDX microanalysis(**). Switchover between high and various pressure mode is completed quickly with a single click of the mouse and requires no hardware change by the user.

The specimen chamber and stage have been designed to accommodate samples as large as 153mm in diameter. Simultaneous EDXmicroanalysis and imaging can be completed on a sample that is 60mm in height at the analytical working distance of 15mm. Flexibility for sample size is a key feature of the SU-1500.


The ESED-II (***) is optionally available if secondary electron imaging in variable pressure mode is desired. This detector is integrated into the GUI of the SU-1500 and is completely software driven with all automatic features ready for instant use by the operator. Feafures at a glance


(*):When compared with Hitachi S-3000N SEM
(**):Energy dispersive X-ray microanalysis (option)
(***):Environmental Secondary Electron Detector (option)
SU-1500 brochure download






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